Compositional analysis surface and interface. Atom-probe field ion microscope.
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چکیده
منابع مشابه
Analysis at the Atomic Level: The Atom Probe Field-Ion Microscope
Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
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ژورنال
عنوان ژورنال: Nihon Kessho Gakkaishi
سال: 1987
ISSN: 0369-4585,1884-5576
DOI: 10.5940/jcrsj.29.102